In Situ Hall Effect Monitoring of Vacuum Annealing of In2O3:H Thin Films

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In Situ Hall Effect Monitoring of Vacuum Annealing of In2O3:H Thin Films

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ژورنال

عنوان ژورنال: Materials

سال: 2015

ISSN: 1996-1944

DOI: 10.3390/ma8020561